In CIX software version 1.5, an improved autofocus procedure and optional overview scan speed up the automatic analysis, making it even easier to produce consistent results rapidly.
FREMONT, CA: The latest software update for the OLYMPUS CIX100 cleanliness inspection system adds a new microscope mode, giving component manufacturers an all-in-one imaging solution for particle analysis and microscope inspections.
For the medical, life sciences, and industrial equipment industries, Olympus is committed to developing customer-driven solutions. Olympus has spent more than a century working to make people's lives better, safer, and more rewarding by assisting in the detection, prevention, and treatment of disease, as well as boosting scientific research and safeguarding public safety.
With a guided workflow, analysis tools, and integrated industry standards, the CIX100 system is a turnkey solution dedicated to technical cleanliness inspection. In CIX software version 1.5, an improved autofocus procedure and optional overview scan speed up the automatic analysis, making it even easier to produce consistent results rapidly. The new microscopy mode allows users to exit the dedicated cleanliness inspection workflow and microscopic imaging for different purposes.
Microscope Mode with Material Solutions
Microscope mode capabilities can be enhanced with various optional material analysis options, ranging from interactive microscopy and layer thickness measurement in surface coatings to automatic grain size evaluation, allowing customers to tailor the system to their specific requirements.
Enhancements to Cleanliness Inspection Software
When the overview scan is not required for routine cleanliness applications, the update adds a shortened approach. Users will benefit from faster scanning, enhanced autofocus, and fiber categorization, as well as a deactivation option.
SQL Server Update
New OLYMPUS CIX100 systems come with CIX software version 1.5 and Microsoft SQL Server 2017.
Now the OLYMPUS CIX100 system supports the ASTM E1216-11 standard, including the Surface Cleanliness Index (SCI) calculation.
Update to CIX Software Version 1.5
CIX100 customers* may use their existing license for a free update to CIX software version 1.5. Material analysis solutions in the microscope mode require a separate license to be purchased.